Wavefront retrieval of amplified femtosecond beams by second-harmonic generation
Second harmonic generation
2209.13 Óptica no lineal
Fecha de publicación
Optical Society of America
Optics Express 19 (23), 22851-22862
We present a new approach for wavefront characterization of near transform-limited intense femtosecond beams using the angular and spectral dependences of the second-harmonic generation conversion efficiency in uniaxial crystals. The method is applied to different aberrated beams and results are compared with the measurements performed with a commercial sensor, finding very good agreement. The phase retrieval dependence with different parameters (e.g. crystal thickness) is discussed. Successful application to sharpen intensity profiles is also demonstrated.