Experimental verification of low-frequency noise effects at the onset of oscillations in planar Gunn diodes
Fecha de publicación
Ó. García-Pérez, Y. Alimi, A. Song, I. Íñiguez-de-la-Torre, S. Pérez, J. Mateos, and T. González; Experimental verification of low-frequency noise effects at the onset of oscillations in planar Gunn diodes; 2015 International Conference on Noise and Fluctuations, ICNF 2015: DOI: 10.1109/ICNF.2015.7288553
In this work, the presence of an anomalous type of low-frequency noise associated with the initiation of the oscillatory regime in Gunn diodes has been studied and experimentally evidenced. When incipient instabilities begin to appear in the device, its intermittent nature drastically enhances the noise at frequencies well below the oscillation. For higher bias voltages, the oscillation becomes purer and the associated low-frequency noise disappears.