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dc.contributor.authorOrfao e Vale Tabernero, Beatriz
dc.contributor.authorGarcía Vasallo, Beatriz 
dc.contributor.authorMoro-Melgar, Diego
dc.contributor.authorPérez Santos, María Susana 
dc.contributor.authorMateos López, Javier 
dc.contributor.authorGonzález Sánchez, Tomás 
dc.date.accessioned2020-10-27T12:21:12Z
dc.date.available2020-10-27T12:21:12Z
dc.date.issued2020
dc.identifier.citationB. Orfao, B. G. Vasallo, D. Moro-Melgar, S. Pérez, J. Mateos and T. González, "Analysis of Surface Charge Effects and Edge Fringing Capacitance in Planar GaAs and GaN Schottky Barrier Diodes," in IEEE Transactions on Electron Devices, vol. 67, no. 9, pp. 3530-3535, Sept. 2020, doi: 10.1109/TED.2020.3007374
dc.identifier.issn0018-9383
dc.identifier.urihttp://hdl.handle.net/10366/144052
dc.description.abstract[EN]In this article, by means of a 2-D ensemble Monte Carlo simulator, the Schottky barrier diodes (SBDs) with realistic geometries based on GaAs and GaN are studied as promising devices for increasing the high-frequency performance- and power-handling capability of frequency mixers and multipliers. The nonlinearity of the capacitance–voltage (C–V) characteristic is the most important parameter for optimizing the performance of SBDs as frequencymultipliers. The small size of the diodes used for ultrahigh-frequency applications makes the value of its intrinsic capacitance to deviate from the ideal one due to fringing effects. We have observed that the value of the edge capacitancewell into reverse bias does not depend on the applied voltage. We define an edge-effect parameter beta, which, interestingly, is affected by the presence or absence of surface charges at the semiconductor–dielectric interface, sigma . Two physical models have been considered: a fixed sigma related to a surface potential Vs constant surface-charge model (CCM) and a self-consistent model in which the local value of sigma is dynamically evaluated depending on the surrounding electron density self-consistent surface-charge model (SCCM). Using the CCM, we obtain that beta depends on the depth of the depletion region Ws created by the surface charges, nearly irrespectively of the epilayer doping or semiconductor type. The more realistic SCCM indicates that, at low frequencies, when the surface charges are able to follow the variations of the applied voltage, the value of beta approaches the one obtained without surface charges,while the high-frequency value (the significant one) is smaller.es_ES
dc.description.sponsorshipSpanish MINECO and FEDER under Project TEC2017-83910-R and Junta de Castilla y León and FEDER under Project SA254P18.es_ES
dc.format.mimetypeapplication/pdf
dc.language.isoenges_ES
dc.subjectEdge effectses_ES
dc.subjectGaAs
dc.subjectMonte Carlo method
dc.subjectSchottky diodes
dc.subjectGaN
dc.titleAnalysis of Surface Charge Effects and Edge Fringing Capacitance in Planar GaAs and GaN Schottky Barrier Diodeses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.relation.publishversionhttps://doi.org/10.1109/TED.2020.3007374
dc.identifier.doi10.1109/TED.2020.3007374
dc.relation.projectIDTEC2017-83910-Res_ES
dc.relation.projectIDSA254P18es_ES
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses_ES
dc.identifier.essn1557-9646
dc.journal.titleIEEE Transactions on Electron Deviceses_ES
dc.volume.number67es_ES
dc.issue.number9es_ES
dc.page.initial3530es_ES
dc.page.final3535es_ES
dc.type.hasVersioninfo:eu-repo/semantics/publishedVersiones_ES


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