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dc.contributor.authorIglesias Pérez, José Manuel 
dc.contributor.authorPascual Corral, Elena 
dc.contributor.authorSergio, García Sánchez 
dc.contributor.authorRengel Estévez, Raúl 
dc.date.accessioned2024-01-23T12:34:23Z
dc.date.available2024-01-23T12:34:23Z
dc.date.issued2023-07
dc.identifier.citationJ. M. Iglesias, E. Pascual, S. García-Sánchez, R. Rengel; 2D MoS2 under switching field conditions: Study of high-frequency noise velocity fluctuations. Appl. Phys. Lett. 31 July 2023; 123 (5): 052105. https://doi.org/10.1063/5.0152078es_ES
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/10366/154553
dc.description.abstractThe transient high-frequency noise response of two-dimensional MoS2 under abrupt large signal switching field conditions is studied by means of an ensemble Monte Carlo simulator. Low-to-high and high-to-low transitions are analyzed at low (77 K) and room temperature, considering several underlying substrates. The incorporation of stochastic individual scattering events allows capturing the transient collective phonon-electron coupling, which is shown to be responsible for the appearance of an oscillatory behaviour in the average velocity and energy at low temperature in the case of MoS2 on SiO2, hBN and Al2O3. Activation and deactivation of surface polar phonon emissions in the low-to-high field switching process yield to the appearance of a relevant peak in the power spectral density of velocity fluctuations in the THz range. The results show the important influence of the substrate type in the noise behaviour of MoS2 at very high frequencies, which is critical for the design of future FET devices based on 2D TMD technology.es_ES
dc.format.mimetypeapplication/pdf
dc.language.isoenges_ES
dc.subjectElectronic transportes_ES
dc.subjectSemiconductorses_ES
dc.subjectElectronic noisees_ES
dc.subjectSignal processinges_ES
dc.subjectElementary particle interactionses_ES
dc.subjectStochastic processeses_ES
dc.title2D MoS2 under switching field conditions: Study of high-frequency noise velocity fluctuationses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.relation.publishversionhttps://doi.org/10.1063/5.0152078es_ES
dc.subject.unesco1208.08 Procesos Estocásticoses_ES
dc.subject.unesco2211.25 Semiconductoreses_ES
dc.subject.unesco2203.06 Transporte de Electroneses_ES
dc.identifier.doi10.1063/5.0152078
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses_ES
dc.identifier.essn1077-3118
dc.journal.titleApplied Physics Letterses_ES
dc.volume.number123es_ES
dc.issue.number5es_ES
dc.type.hasVersioninfo:eu-repo/semantics/publishedVersiones_ES


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