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dc.contributor.authorSergio, García Sánchez 
dc.contributor.authorÍñiguez de la Torre Mulas, Ignacio 
dc.contributor.authorPérez Santos, María Susana 
dc.contributor.authorGonzález Sánchez, Tomás 
dc.date.accessioned2024-09-02T07:45:37Z
dc.date.available2024-09-02T07:45:37Z
dc.date.issued2024
dc.identifier.citationS. García-Sánchez, I. Íñiguez-de-la-Torre, S. Pérez, T. González and J. Mateos, "Monte Carlo Study of Gunn Oscillations in Geometrically Shaped Planar Gunn Diodes Based on Doped GaN: Influence of Geometry, Intervalley Energy, and Temperature," in IEEE Transactions on Electron Devices, vol. 71, no. 10, pp. 5901-5907, Oct. 2024, doi: 10.1109/TED.2024.3438114.
dc.identifier.issn0018-9383
dc.identifier.urihttp://hdl.handle.net/10366/159401
dc.description.abstract[EN]—An investigation into self-switching diodes based on highly doped GaN is conducted under direct current (DC) bias conditions. Different device geometries are explored under various lattice temperatures and polarization scenarios. Also, the impact of adopting an intervalley energy ε1−2=0.9eV for this material is examined and compared with results obtained with the traditionally accepted value of 2.2eV. For a rectangular channel configuration, simulations predict oscillation frequencies in excess of 200GHz, much above the expected transit-time value, due to the fact that the Gunn domains are formed near the anode side of the channel. Conversely, structures with a V-shape geometry are able to start the formation of the Gunn domain inside the channel, thus generating oscillations at much lower frequencies (tens of GHz). The key result is that the lower ε1−2 leads to smaller threshold voltage values (and also slightly smaller oscillation frequencies), particularly in diodes with short channels.es_ES
dc.format.mimetypeapplication/pdf
dc.language.isoenges_ES
dc.publisherIEEEes_ES
dc.titleMonte Carlo Study of Gunn Oscillations in Geometrically Shaped Planar Gunn Diodes Based on Doped GaN: Influence of Geometry, Intervalley Energy, and Temperaturees_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.relation.publishversionhttps://doi.org/10.1109/TED.2024.3438114
dc.identifier.doi10.1109/TED.2024.3438114
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses_ES
dc.identifier.essn1557-9646
dc.journal.titleIEEE Transactions on Electron Deviceses_ES
dc.page.initial1es_ES
dc.page.final0es_ES
dc.type.hasVersioninfo:eu-repo/semantics/draftes_ES


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