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Título
Probing ultrafast-laser inscribed waveguides in Er:LiYF4 via μ-spectroscopy for refractive-index engineering
Autor(es)
Palabras clave
Phonons
Waveguides
Crystallographic defects
Differential interference contrast microscopy
Optical properties
Compressive stress
Spectroscopy
Birefringence
Ultrafast lasers
Fecha de publicación
2026-03
Editor
AIP Publishing
Citación
Ji Eun Bae, Pavel A. Loiko, Carolina Romero, Javier R. Vázquez de Aldana, Xavier Mateos, Abdelmjid Benayad, Alain Braud, Patrice Camy; Probing ultrafast-laser inscribed waveguides in Er:LiYF4 via μ-spectroscopy for refractive-index engineering. Appl. Phys. Lett. 2 March 2026; 128 (9): 091101. https://doi.org/10.1063/5.0318207
Resumen
[EN]Ultrafast-laser inscription enables the fabrication of three-dimensional photonic microstructures in laser-active dielectric crystals, yet the interplay between geometry and laser-induced refractive-index changes remains insufficiently quantified. We investigate depressed-cladding waveguides written in a uniaxial Er3+:LiYF4 fluoride crystal using spatially resolved confocal luminescence and Raman spectroscopy with sub-micrometric resolution. The measurements reveal partial amorphization within the irradiated zones, as well as a complex distribution of local stress fields—compressive within the cladding and tensile at the periphery of the core. These stress patterns, and the associated refractive-index modifications, are found to be highly sensitive to the cladding geometry. From the spectroscopic analysis, we estimate a maximum compressive stress of 1 GPa and a refractive-index change of −2.6 × 10−3 for the e-wave within the damage tracks. Complementary differential interference contrast (Nomarski) microscopy yields quantitative maps of stress-induced birefringence, on the order of 10−6—well below the intrinsic birefringence of LiYF4 and therefore not detrimental to the polarization properties of laser waveguides. Based on these findings, we provide design guidelines for optimizing mid-infrared waveguide structures.
URI
ISSN
0003-6951
DOI
10.1063/5.0318207
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