Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10366/122124
Evidence of surface charge effects in T-branch nanojunctions using microsecond-pulse testing: Profile on PlumX
Título : Evidence of surface charge effects in T-branch nanojunctions using microsecond-pulse testing
Autor(es) : Íñiguez-de-la-Torre, Ignacio
Mateos López, Javier
Roelens, Yannick
Gardes, Cyrille
Bollaert, Sylvain
González Sánchez, Tomás
Palabras clave : Nanodevices
Monte Carlo method
Ballistic transport
Pulsed measurements
Clasificación UNESCO: Materias::Investigación::22 Física
Fecha de publicación : 2011
Citación : Íñiguez de la Torre, I. et al. (2011). Evidence of surface charge effects in T-branch nanojunctions using microsecond-pulse testing. Nanotechnology 22, 445203.
Resumen : The understanding of the influence of surface charge effects on the electrical properties of nanostructures is a key aspect for the forthcoming generations of electronic devices. In this work, by using an ultrafast electrical pulse characterization technique, we report on the room-temperature time response of a T-branch nanojunction which allows identifying the signature of surface states. Different pulse widths from 500 ns to 100 µs were applied to the device. For a given pulse width, the stem voltage is measured and compared with the DC result. The output value in the stem is found to depend on the pulse width and to be related to the characteristic charging time of the interface states. As expected, the results show that the well-know nonlinear response of T-branch junctions is more pronounced for long pulses, beyond such a characteristic time.
URI : http://hdl.handle.net/10366/122124
ISSN : 0957-4484
Aparece en las colecciones: Documentos OpenAire (Open Access Infrastructure for Research in Europe)
DFA. Artículos del Departamento de Física Aplicada

Ficheros en este ítem:
Fichero Descripción Tamaño Formato  
2011 Ignacio Nanotechnology.pdf239,6 kBAdobe PDFVista previa
Visualizar/Abrir


Este ítem está sujeto a una licencia Licencia Creative Commons