Please use this identifier to cite or link to this item: http://hdl.handle.net/10366/130337
Experimental assessment of anomalous low-frequency noise increase at the onset of Gunn oscillations in InGaAs planar diodes: Profile on PlumX
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dc.contributor.authorGarcía Pérez, Óscar Alberto-
dc.contributor.authorAlimi, Yasaman-
dc.contributor.authorSong, Aimin M.-
dc.contributor.authorÍñiguez-de-la-Torre, Ignacio-
dc.contributor.authorPérez Santos, María Susana-
dc.contributor.authorMateos López, Javier-
dc.contributor.authorGonzález Sánchez, Tomás-
dc.date.accessioned2016-09-27T08:07:04Z-
dc.date.available2016-09-27T08:07:04Z-
dc.date.issued2014-
dc.identifier.citationO. García-Pérez, Y. Alimi, A. M. Song, I. Iñiguez-de-la-Torre, S. Pérez, J. Mateos and T. González; Experimental assessment of anomalous low-frequency noise increase at the onset of Gunn oscillations in InGaAs planar diodes; Applied Physics Letters 105, 113502 [1-4] (2014)es_ES
dc.identifier.urihttp://hdl.handle.net/10366/130337-
dc.description.abstractIn this work, the presence of anomalous low-frequency fluctuations during the initiation of higher frequency oscillations in InGaAs-based Gunn planar diodes has been evidenced and investigated. Accurate measurements showing the evolution of the power spectral density of the device with respect to the applied voltage have been carried out. Such spectra have been obtained in the wide frequency range between 10MHz and 43.5 GHz, simultaneously covering both the low-frequency noise and the fundamental oscillation peak at some tens of GHz. This provides valuable information to better understand how these fluctuations appear and how these are distributed in frequency. For much higher frequency operation, such understanding can be utilized as a simple tool to predict the presence of Gunn oscillations without requiring a direct detection.es_ES
dc.format.mimetypeapplication/pdf-
dc.language.isoenges_ES
dc.publisherAmerican Institute of Physicses_ES
dc.rightsinfo:eu-repo/semantics/openAccess-
dc.subjectNoisees_ES
dc.subjectGunn oscillationses_ES
dc.subjectInGaAses_ES
dc.subjectGunn diodeses_ES
dc.titleExperimental assessment of anomalous low-frequency noise increase at the onset of Gunn oscillations in InGaAs planar diodeses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.rights.licenseCC Reconocimiento - No comercial - Sin obras derivadas 3.0 España-
dc.identifier.doihttp://dx.doi.org/10.1063/1.4896050-
dc.relation.projectIDTEC2013-41640-Res_ES
dc.relation.projectIDSA052U13es_ES
Appears in Collections:GINEAF. Artículos del Grupo de Investigación en Nanodispositivos Electrónicos de Alta Frecuencia

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