Please use this identifier to cite or link to this item: http://hdl.handle.net/10366/130683
Experimental verification of low-frequency noise effects at the onset of oscillations in planar Gunn diodes: Profile on PlumX
Title: Experimental verification of low-frequency noise effects at the onset of oscillations in planar Gunn diodes
Authors: García Pérez, Óscar Alberto
Íñiguez-de-la-Torre, Ignacio
Pérez Santos, María Susana
Mateos López, Javier
González Sánchez, Tomás
Alimi, Yasaman
Song, Aimin M.
Keywords: Noise
Gunn oscillations
InGaAs diodes
Issue Date: 2015
Publisher: IEEE
Citation: Ó. García-Pérez, Y. Alimi, A. Song, I. Íñiguez-de-la-Torre, S. Pérez, J. Mateos, and T. González; Experimental verification of low-frequency noise effects at the onset of oscillations in planar Gunn diodes; 2015 International Conference on Noise and Fluctuations, ICNF 2015: DOI: 10.1109/ICNF.2015.7288553
Abstract: In this work, the presence of an anomalous type of low-frequency noise associated with the initiation of the oscillatory regime in Gunn diodes has been studied and experimentally evidenced. When incipient instabilities begin to appear in the device, its intermittent nature drastically enhances the noise at frequencies well below the oscillation. For higher bias voltages, the oscillation becomes purer and the associated low-frequency noise disappears.
URI: http://hdl.handle.net/10366/130683
Appears in Collections:GINEAF. Artículos del Grupo de Investigación en Nanodispositivos Electrónicos de Alta Frecuencia

Files in This Item:
File Description SizeFormat 
ICNF-2015c.pdf540,43 kBAdobe PDFThumbnail
View/Open


This item is is subject to a Creative Commons License