2024-03-28T12:41:37Zhttps://gredos.usal.es/oai/requestoai:gredos.usal.es:10366/1399342022-02-07T15:38:38Zcom_10366_133237com_10366_4512com_10366_3823col_10366_133238
Measurement of Ultrashort Vector Pulses From Polarization Gates by In-Line, Single-Channel Spectral Interferometry
Alonso Fernández, Benjamín
Sola Larrañaga, Iñigo Juan
Ultrafast lasers
Ultrashort pulses
Optical polarization measurements
Vector pulses
Polarization gate
[EN]The growing use of ultrashort laser pulses exhibiting
time-varying polarization (vector pulses) demands simple and
robust characterization techniques capable to perform
measurements in a broad range of experimental and
environmental conditions. Here we present in-line, single-channel
setup based on spectral interferometry to characterize ultrashort
vector pulses. The use of a bulk interferometer based on
birefringence is key for the stability and sensitivity of the
technique, thus being simple and highly robust. The technique is
used to measure vector pulses corresponding to polarization gates,
which are used in many applications. Those results are validated
by simulations. The technique here presented has a number of
potential applications in nonlinear effects (e.g. transient
birefringence and nonlinear phenomena with vector pulses).
2019-10-10T08:46:04Z
2019-10-10T08:46:04Z
2019-10-10T08:46:04Z
2019
info:eu-repo/semantics/article
B. Alonso and Í. Sola (2019). Measurement of Ultrashort Vector Pulses From Polarization Gates by In-Line, Single-Channel Spectral Interferometry. IEEE Journal of Selected Topics in Quantum Electronics, 25 (4), pp. 1-7. doi: 10.1109/JSTQE.2019.2906266
1077-260X
http://hdl.handle.net/10366/139934
10.1109/JSTQE.2019.2906266
1558-4542
eng
https://doi.org/10.1109/JSTQE.2019.2906266
Junta de Castilla y León SA287P18
MINECO FIS2017-87970-R
MINECO EQC2018-004117-P
Marie Sklodowska-Curie Individual Fellowship (798264)
info:eu-repo/semantics/openAccess
Institute of Electrical and Electronics Engineers (Nueva York, Estados Unidos). Lasers and Electro-Optics Society