RT info:eu-repo/semantics/article
T1 Experimental verification of low-frequency  noise effects at the onset of oscillations  in planar Gunn diodes
A1 García Pérez, Óscar Alberto
A1 Íñiguez-de-la-Torre, Ignacio
A1 Pérez Santos, María Susana
A1 Mateos López, Javier
A1 González Sánchez, Tomás
A1 Alimi, Yasaman
A1 Song, Aimin M.
K1 Noise
K1 Gunn oscillations
K1 InGaAs diodes
AB In this work, the presence of an anomalous type of low-frequency noise associated with the initiation of the oscillatory regime in Gunn diodes has been studied and experimentally evidenced. When incipient instabilities begin to appear in the device, its intermittent nature drastically enhances the noise at frequencies well below the oscillation. For higher bias voltages, the oscillation becomes purer and the associated low-frequency noise disappears.
PB IEEE
YR 2015
FD 2015
LK http://hdl.handle.net/10366/130683
UL http://hdl.handle.net/10366/130683
LA eng
NO Ó. García-Pérez, Y. Alimi, A. Song, I. Íñiguez-de-la-Torre, S. Pérez, J. Mateos, and T. González; Experimental verification of low-frequency noise effects at the onset of oscillations in planar Gunn diodes; 2015 International Conference on Noise and Fluctuations, ICNF 2015: DOI: 10.1109/ICNF.2015.7288553
DS Gestión del Repositorio Documental de la Universidad de Salamanca
RD 19-abr-2024