TY - JOUR AU - Talbo, Vincent AU - Mateos López, Javier AU - Retailleau, Sylvie AU - Dollfus, Philippe AU - González Sánchez, Tomás PY - 2014 UR - http://hdl.handle.net/10366/130635 AB - The simulation of a double-tunnel junction with the SENS simulator gives access to the frequency-dependent and static behavior of shot noise. The concept of basic paths in a multi-state process provides a clear interpretation of the noise regimes,... LA - eng PB - IEEE KW - Shot noise KW - Single electron device TI - Frequency-dependent shot noise in single-electron devices DO - 10.1109/IWCE.2014.6865843 ER -