TY  - JOUR 
AU  - González Sánchez, Tomás
PY  - 2015
UR  - http://hdl.handle.net/10366/130682
AB  - Electronic noise, despite being a limiting factor in many applications of semiconductor devices and integrated circuits, constitutes also a source of information about the microscopic processes taking place inside the devices. The level of noise and...
LA  - eng
PB  - IEEE
KW  - Carrier dynamics
KW  - Noise
KW  - Noise suppression
KW  - Impact ionization
TI  - Carrier Dynamics Probed by Noise in High-Frequency Electronic Devices
DO  - 10.1109/ICNF.2015.7288541
ER  -