TY  - JOUR 
AU  - López Díaz, David
AU  - Delgado Notario, Juan Antonio
AU  - Clericò, Vito
AU  - Díez Fernández, Enrique
AU  - Merchán Moreno, María Dolores
AU  - Velázquez Salicio, María Mercedes
PY  - 2020
UR  - http://hdl.handle.net/10366/157975
AB  - [EN]Raman spectroscopy is a technique widely used to detect defects in semiconductors because it provides information of structural or chemical defects produced in its structure. In the case of graphene monolayer, the Raman spectrum presents two bands...
LA  - eng
PB  - MDPI
KW  - Graphene oxide
KW  - Hexagonal boron nitride
KW  - Raman
KW  - Heterostructures
TI  - Towards Understanding the Raman Spectrum of Graphene Oxide: The Effect of the Chemical Composition
DO  - 10.3390/coatings10060524
T2  - Coatings
VL  - 10
M2  - 524
ER  -