TY  - JOUR 
AU  - García Sánchez, Sergio
AU  - Íñiguez-de-la-Torre, Ignacio
AU  - García Pérez, Óscar Alberto
AU  - Mateos López, Javier
AU  - González Sánchez, Tomás
AU  - Pérez Santos, María Susana
PY  - 2015
UR  - http://hdl.handle.net/10366/130632
AB  - In this paper we evaluate heat diffusion in an AlGaN/GaN diode through a Monte
Carlo simulator by expanding its capabilities with the implementation of two thermal methods.
We present the impact on the device temperature of considering different...
LA  - eng
PB  - Institute of Physics (Bristol, Gran Bretaña)
KW  - Thernal boundary resistance
KW  - Heating
KW  - Monte-Carlo, Método de
KW  - AlGaN/GaN
TI  - Modelling of Thermal Boundary Resistance in a GaN Diode by means of Electro-Thermal Monte Carlo Simulations
DO  - 10.1088/1742-6596/609/1/012005
ER  -