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dc.contributor.authorMateos López, Javier 
dc.contributor.authorGonzález Sánchez, Tomás 
dc.date.accessioned2013-09-03T07:44:55Z
dc.date.available2013-09-03T07:44:55Z
dc.date.issued2012
dc.identifier.citationJ. Mateos and T. Gonzalez, "Plasma Enhanced Terahertz Rectification and Noise in InGaAs HEMTs," in IEEE Transactions on Terahertz Science and Technology, vol. 2, no. 5, pp. 562-569, Sept. 2012, doi: 10.1109/TTHZ.2012.2209970es_ES
dc.identifier.urihttp://hdl.handle.net/10366/122102
dc.description.abstractIn this work we explore high frequency collective phenomena present in InGaAs HEMTs which lead to a peak in the current noise spectrum and enhance their DC response to THz signals, thus originating a resonance in the rectification of AC signals. These phenomena have been evidenced in recent experiments, in which THz detection as a result of plasma wave resonances has been demonstrated. In this paper, by means of Monte Carlo simulations, the noise spectra and the AC to DC rectification properties of the devices have been calculated and linked to the properties of the plasma oscillations within two distinct parts of the source-gate region: the capped and the recessed sections of the channel.es_ES
dc.description.sponsorshipROOTHz (FP7-243845)es_ES
dc.language.isoenges_ES
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Unported
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/3.0/
dc.subjectInGaAs HEMTses_ES
dc.subjectMonte Carlo methodes_ES
dc.subjectPlasma Oscillationses_ES
dc.titlePlasma enhanced terahertz rectification and noise in InGaAs HEMTses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.relation.publishversionhttps://doi.org/10.1109/TTHZ.2012.2209970
dc.subject.unesco22 Físicaes_ES
dc.identifier.doi10.1109/TTHZ.2012.2209970
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess


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