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dc.contributor.authorMoro-Melgar, Diego
dc.contributor.authorMaestrini, Alain
dc.contributor.authorTreuttel, Jeanne
dc.contributor.authorGatilova, Lina
dc.contributor.authorGonzález Sánchez, Tomás 
dc.contributor.authorGarcía Vasallo, Beatriz 
dc.contributor.authorMateos López, Javier 
dc.date.accessioned2016-10-06T11:33:32Z
dc.date.available2016-10-06T11:33:32Z
dc.date.issued2016
dc.identifier.citationMonte Carlo Study of 2-D Capacitance Fringing Effects in GaAs Planar Schottky Diodes - D. Moro-Melgar, A. Maestrini, J. Treuttel, L. Gatilova, T. González, B. G. Vasallo, and J. Mateos - IEEE Transactions on Electron Devices 63, 3900-3907 (2016)es_ES
dc.identifier.urihttp://hdl.handle.net/10366/130698
dc.description.abstractNanometer scale planar Schottky barrier diodes (SBDs) with realistic geometries have been studied by means of a 2-D ensemble Monte Carlo simulator. The topology of the devices studied in this paper is based in real planar GaAs SBDs used in terahertz applications, such as passive frequency mixing and multiplication, in which accurate models for the diode capacitance are required. The intrinsic capacitance of such small devices, which due to edge effects strongly deviates from the ideal value, has been calculated. In good agreement with the classical models, we have found that the edge capacitance is independent of the properties of the semiconductor beneath the contact and, as novel result, that the presence of surface charges at the semiconductor dielectric interface can reduce it almost 15%. We have finally provided a compact model for the total capacitance of diodes with arbitrary shape that could be easily implemented in design automation software such as Advance Design System (ADS).es_ES
dc.format.mimetypeapplication/pdf
dc.language.isoenges_ES
dc.publisherIEEEes_ES
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Unported
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/3.0/
dc.subjectMonte Carlo methodes_ES
dc.subjectCapacitancees_ES
dc.subjectSchottky diodeses_ES
dc.subjectFringing effectses_ES
dc.titleMonte Carlo Study of 2-D Capacitance Fringing Effects in GaAs Planar Schottky Diodeses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.identifier.doi10.1109/TED.2016.2601341
dc.relation.projectIDTEC2013-41640-Res_ES
dc.relation.projectIDSA052U13es_ES
dc.relation.projectIDANR-10-IDEX-0001-02es_ES
dc.relation.projectID2011-LABX-030es_ES
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess


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