| dc.contributor.author | Moro-Melgar, Diego | |
| dc.contributor.author | Maestrini, Alain | |
| dc.contributor.author | Treuttel, Jeanne | |
| dc.contributor.author | Gatilova, Lina | |
| dc.contributor.author | González Sánchez, Tomás | |
| dc.contributor.author | García Vasallo, Beatriz | |
| dc.contributor.author | Mateos López, Javier | |
| dc.date.accessioned | 2016-10-06T11:33:32Z | |
| dc.date.available | 2016-10-06T11:33:32Z | |
| dc.date.issued | 2016 | |
| dc.identifier.citation | Monte Carlo Study of 2-D Capacitance Fringing Effects in GaAs Planar Schottky Diodes - D. Moro-Melgar, A. Maestrini, J. Treuttel, L. Gatilova, T. González, B. G. Vasallo, and J. Mateos - IEEE Transactions on Electron Devices 63, 3900-3907 (2016) | es_ES |
| dc.identifier.uri | http://hdl.handle.net/10366/130698 | |
| dc.description.abstract | Nanometer scale planar Schottky barrier
diodes (SBDs) with realistic geometries have been studied
by means of a 2-D ensemble Monte Carlo simulator. The
topology of the devices studied in this paper is based in real
planar GaAs SBDs used in terahertz applications, such as
passive frequency mixing and multiplication, in which accurate
models for the diode capacitance are required. The intrinsic
capacitance of such small devices, which due to edge effects
strongly deviates from the ideal value, has been calculated.
In good agreement with the classical models, we have found
that the edge capacitance is independent of the properties of
the semiconductor beneath the contact and, as novel result, that
the presence of surface charges at the semiconductor dielectric
interface can reduce it almost 15%. We have finally provided a
compact model for the total capacitance of diodes with arbitrary
shape that could be easily implemented in design automation
software such as Advance Design System (ADS). | es_ES |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | eng | es_ES |
| dc.publisher | IEEE | es_ES |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Unported | |
| dc.rights.uri | https://creativecommons.org/licenses/by-nc-nd/3.0/ | |
| dc.subject | Monte Carlo method | es_ES |
| dc.subject | Capacitance | es_ES |
| dc.subject | Schottky diodes | es_ES |
| dc.subject | Fringing effects | es_ES |
| dc.title | Monte Carlo Study of 2-D Capacitance Fringing Effects in GaAs Planar Schottky Diodes | es_ES |
| dc.type | info:eu-repo/semantics/article | es_ES |
| dc.identifier.doi | 10.1109/TED.2016.2601341 | |
| dc.relation.projectID | TEC2013-41640-R | es_ES |
| dc.relation.projectID | SA052U13 | es_ES |
| dc.relation.projectID | ANR-10-IDEX-0001-02 | es_ES |
| dc.relation.projectID | 2011-LABX-030 | es_ES |
| dc.rights.accessRights | info:eu-repo/semantics/openAccess | |