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Título
2D MoS2 under switching field conditions: Study of high-frequency noise velocity fluctuations
Autor(es)
Palabras clave
Electronic transport
Semiconductors
Electronic noise
Signal processing
Elementary particle interactions
Stochastic processes
Clasificación UNESCO
1208.08 Procesos Estocásticos
2211.25 Semiconductores
2203.06 Transporte de Electrones
Fecha de publicación
2023-07
Citación
J. M. Iglesias, E. Pascual, S. García-Sánchez, R. Rengel; 2D MoS2 under switching field conditions: Study of high-frequency noise velocity fluctuations. Appl. Phys. Lett. 31 July 2023; 123 (5): 052105. https://doi.org/10.1063/5.0152078
Resumen
The transient high-frequency noise response of two-dimensional MoS2 under abrupt large signal switching
field conditions is studied by means of an ensemble Monte Carlo simulator. Low-to-high and high-to-low
transitions are analyzed at low (77 K) and room temperature, considering several underlying substrates. The
incorporation of stochastic individual scattering events allows capturing the transient collective phonon-electron
coupling, which is shown to be responsible for the appearance of an oscillatory behaviour in the average velocity
and energy at low temperature in the case of MoS2 on SiO2, hBN and Al2O3. Activation and deactivation of
surface polar phonon emissions in the low-to-high field switching process yield to the appearance of a relevant
peak in the power spectral density of velocity fluctuations in the THz range. The results show the important
influence of the substrate type in the noise behaviour of MoS2 at very high frequencies, which is critical for the
design of future FET devices based on 2D TMD technology.
URI
ISSN
0003-6951
DOI
10.1063/5.0152078
Versión del editor
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