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dc.contributor.authorTalbo, Vincent
dc.contributor.authorMateos López, Javier 
dc.contributor.authorRetailleau, Sylvie
dc.contributor.authorDollfus, Philippe
dc.contributor.authorGonzález Sánchez, Tomás 
dc.date.accessioned2016-10-04T07:52:03Z
dc.date.available2016-10-04T07:52:03Z
dc.date.issued2015
dc.identifier.citationV. Talbo, J. Mateos, S. Retailleau, P. Dollfus and T. González; Time-dependent shot noise in multi-level quantum dot-based single-electron devices; Semiconductor Science and Technology 30, 055002 [1-7] (2015)es_ES
dc.identifier.urihttp://hdl.handle.net/10366/130648
dc.description.abstractBy means of three-dimensional self-consistent simulation, we investigate the time- and frequency-dependent shot noise in multi-level quantum dot (QD)-based double-tunnel junction by analyzing auto-correlation functions and distribution of waiting times between consecutive tunnel events through a given barrier. We derive analytic expressions for correlation and waiting time distributions (WTDs) in the case of a maximum of two electrons in the QD. We separate the contributions of the different evolution paths of the number of electrons in the dot between two consecutive current pulses, called ‘basic paths’. The close relation revealed between probabilities, WTDs and correlation functions associated to basic paths allows a good understanding of the specific dynamics in spectral densities. The analytic results show a perfect agreement with those obtained from numerical Monte-Carlo simulation.es_ES
dc.format.mimetypeapplication/pdf
dc.language.isoenges_ES
dc.publisherInstitute of Physics Publishinges_ES
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Unported
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/3.0/
dc.subjectShot noisees_ES
dc.subjectSingle electron devicees_ES
dc.subjectMonte Carlo methodes_ES
dc.subjectDouble-tunnel junctiones_ES
dc.titleTime-dependent shot noise in multi-level quantum dot-based single-electron deviceses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.identifier.doi10.1088/0268-1242/30/5/055002
dc.relation.projectIDTEC2010-15413es_ES
dc.relation.projectIDSA052U13es_ES
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess


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Attribution-NonCommercial-NoDerivs 3.0 Unported
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