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    Título
    Analysis of Surface Charge Effects and Edge Fringing Capacitance in Planar GaAs and GaN Schottky Barrier Diodes
    Autor(es)
    Orfao e Vale Tabernero, Beatriz
    García Vasallo, BeatrizUSAL authority ORCID
    Moro-Melgar, Diego
    Pérez Santos, María SusanaUSAL authority ORCID
    Mateos López, JavierUSAL authority ORCID
    González Sánchez, TomásUSAL authority ORCID
    Palabras clave
    Edge effects
    GaAs
    Monte Carlo method
    Schottky diodes
    GaN
    Fecha de publicación
    2020
    Citación
    B. Orfao, B. G. Vasallo, D. Moro-Melgar, S. Pérez, J. Mateos and T. González, "Analysis of Surface Charge Effects and Edge Fringing Capacitance in Planar GaAs and GaN Schottky Barrier Diodes," in IEEE Transactions on Electron Devices, vol. 67, no. 9, pp. 3530-3535, Sept. 2020, doi: 10.1109/TED.2020.3007374
    Resumen
    [EN]In this article, by means of a 2-D ensemble Monte Carlo simulator, the Schottky barrier diodes (SBDs) with realistic geometries based on GaAs and GaN are studied as promising devices for increasing the high-frequency performance- and power-handling capability of frequency mixers and multipliers. The nonlinearity of the capacitance–voltage (C–V) characteristic is the most important parameter for optimizing the performance of SBDs as frequencymultipliers. The small size of the diodes used for ultrahigh-frequency applications makes the value of its intrinsic capacitance to deviate from the ideal one due to fringing effects. We have observed that the value of the edge capacitancewell into reverse bias does not depend on the applied voltage. We define an edge-effect parameter beta, which, interestingly, is affected by the presence or absence of surface charges at the semiconductor–dielectric interface, sigma . Two physical models have been considered: a fixed sigma related to a surface potential Vs constant surface-charge model (CCM) and a self-consistent model in which the local value of sigma is dynamically evaluated depending on the surrounding electron density self-consistent surface-charge model (SCCM). Using the CCM, we obtain that beta depends on the depth of the depletion region Ws created by the surface charges, nearly irrespectively of the epilayer doping or semiconductor type. The more realistic SCCM indicates that, at low frequencies, when the surface charges are able to follow the variations of the applied voltage, the value of beta approaches the one obtained without surface charges,while the high-frequency value (the significant one) is smaller.
    URI
    https://hdl.handle.net/10366/144052
    ISSN
    0018-9383
    DOI
    10.1109/TED.2020.3007374
    Versión del editor
    https://doi.org/10.1109/TED.2020.3007374
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