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dc.contributor.authorCalvo Gallego, Jaime 
dc.contributor.authorDelgado Notario, Juan Antonio 
dc.contributor.authorFerrando-Bataller, Miguel
dc.contributor.authorFobelets, Kristel
dc.contributor.authorMeziani, Yahya Moubarak 
dc.contributor.authorVelázquez Pérez, Jesús Enrique 
dc.date.accessioned2024-11-04T09:47:00Z
dc.date.available2024-11-04T09:47:00Z
dc.date.issued2021-08-29
dc.identifier.citation. Calvo-Gallego, J. A. Delgado-Notario, M. Ferrando-Bataller, K. Fobelets, Y. M. Meziani and J. E. Velázquez-Pérez, "Electromagnetic Simulation of the Sub-THz Radiation Coupling to n-channel strained-silicon MODFETs," 2021 46th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Chengdu, China, 2021, pp. 1-2, doi: 10.1109/IRMMW-THz50926.2021.9566877.
dc.identifier.issn2162-2027
dc.identifier.urihttp://hdl.handle.net/10366/160468
dc.description.abstract[EN]We report on a study of the coupling of electromagnetic radiation to a strained-silicon MODFETs used as sub-THz terahertz detector. In particular, the effect of the polarization of the incoming beam as well as the role of the bonding wires on the photoresponse generated were addressed. Two tones were considered: 0.15 and 0.30THz. Results show that the device is sensitive to the beam polarization, especially when the beam polarization is perpendicular to the transistor channel under excitation at 0.15THz. We also demonstrated that the bonding wires play a preponderant role in the coupling of the incoming radiation to the channel of the FET under excitation at 0.15THz while they have a minor role at higher frequencies (0.3THz).es_ES
dc.format.mimetypeapplication/pdf
dc.language.isoenges_ES
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectElectromagnetic simulationes_ES
dc.subjectScientific computinges_ES
dc.subjectTerahertz (THz)es_ES
dc.subjectTHz Radiationes_ES
dc.subjectSub-THz Radiation Couplinges_ES
dc.subjectn-channel strained-silicon MODFETses_ES
dc.titleElectromagnetic Simulation of the Sub-THz Radiation Coupling to n-channel strained-silicon MODFETses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.relation.publishversionhttps://doi.org/10.1109/IRMMW-THZ50926.2021.9566877es_ES
dc.subject.unesco1203 Ciencia de los ordenadoreses_ES
dc.subject.unesco3325 Tecnología de las Telecomunicacioneses_ES
dc.subject.unesco3307 Tecnología Electrónicaes_ES
dc.subject.unesco3304 Tecnología de Los Ordenadoreses_ES
dc.identifier.doi10.1109/IRMMW-THz50926.2021.9566877
dc.rights.accessRightsinfo:eu-repo/semantics/embargoedAccesses_ES
dc.journal.title2021 46th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz)es_ES
dc.volume.number2021-Augustes_ES
dc.issue.number1es_ES
dc.page.initial1es_ES
dc.page.final2es_ES
dc.type.hasVersioninfo:eu-repo/semantics/publishedVersiones_ES


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