Monte Carlo analysis of the influence of dc conditions on the upconversion of generation-recombination noise in semiconductors

Título

dc.contributor.author	Pérez Santos, María Susana	es_ES
dc.contributor.author	González Sánchez, Tomás	es_ES
dc.contributor.author	Obregon, J.	es_ES
dc.contributor.author	Delage, Sylvain Laurent
dc.date.accessioned	2009-01-21	es_ES
dc.date.accessioned	2009-10-15T08:53:47Z
dc.date.available	2009-10-15T08:53:47Z
dc.date.issued	2001	es_ES
dc.identifier.citation	Pérez Santos, M.S., González Sánchez, T., Delage, S.L. y Obregon, J. (2001)." Monte Carlo analysis of the influence of dc conditions on the upconversion of generation-recombination noise in semiconductors". Semiconductor science and technology, 16 L8-L11	es_ES
dc.identifier.uri	http://hdl.handle.net/10366/55879	es_ES
dc.description.abstract	Se analiza el método de Monte Carlo
dc.format.extent	4 p.	es_ES
dc.format.mimetype	application/pdf	es_ES
dc.language	Inglés	es_ES
dc.language.iso	eng	es_ES
dc.publisher	Institute of Physics (Londres, Gran Bretaña)	es_ES
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 Unported
dc.rights.uri	https://creativecommons.org/licenses/by-nc-nd/3.0/
dc.subject	Monte-Carlo, Método de	es_ES
dc.subject	Generation-recombination	es_ES
dc.subject.classification	Ruido	es_ES
dc.title	Monte Carlo analysis of the influence of dc conditions on the upconversion of generation-recombination noise in semiconductors	es_ES
dc.type	info:eu-repo/semantics/article	es_ES
dc.relation.publishversion	https://iopscience.iop.org/article/10.1088/0268-1242/16/2/102
dc.identifier.doi	10.1088/0268-1242/16/2/102
dc.rights.accessRights	info:eu-repo/semantics/openAccess